Efficient Resource-Aware Neural Architecture Search with a Neuro-Symbolic Approach
Bellodi, Elena; Bertozzi, Davide; Bizzarri, Alice; Favalli, Michele; Fraccaroli, Michele; Zese, Riccardo     dettagli >>
IEEE Computer society, 2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC)
pp: 171-178, Anno: 2023

The challenge of classification confidence estimation in dynamically-adaptive neural networks
Dall'Occo, Francesco; Bueno-Crespo, Andrés; Abellán, José L.; Bertozzi, Davide; Favalli, Michele     dettagli >>
Springer, Embedded Computer Systems: Architectures, Modeling, and Simulation. 21st International Conference, SAMOS 2021, Virtual Event, July 4–8, 2021, Proceedings
Vol. 13227, No. 1, pp: 505-522, Anno: 2022

Exploring Software Models for the Resilience Analysis of Deep Learning Accelerators: the NVDLA Case Study
Veronesi, A.; Dall'Occo, F.; Bertozzi, D.; Favalli, M.; Krstic, M.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022
pp: 142-147, Anno: 2022

A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices
Dalpasso, Marcello; Bertozzi, Davide; Favalli, Michele     dettagli >>
Institute of Electrical and Electronics Engineers Inc., Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Vol. 2018, No. 1, pp: 297-300, Anno: 2018

A Built-In Self-Testing Framework for Asynchronous Bundled-Data NoC Switches Resilient to Delay Variations
Miorandi, Gabriele; Bertozzi, Davide; Favalli, Michele; Celin, Alberto     dettagli >>
IEEE, Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS) 2016
pp: 113-120, Anno: 2016

Power efficiency of switch architecture extensions for fault tolerant NoC design
Ghiribaldi, Alberto; Strano, Alessandro; Favalli, Michele; Bertozzi, Davide     dettagli >>
IEEE, Green Computing Conference (IGCC), 2012 International
pp: 1-6, Anno: 2012

Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture
Strano, Alessandro; C. G., Requena; Ludovici, Daniele; M. E., Gomez; Favalli, Michele; Bertozzi, Davide     dettagli >>
ACM/IEEE, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
pp: 661-666, Anno: 2011

System-Level Infrastructure for Boot-time Testing and Configuration of Networks-on-Chip with Programmable Routing Logic
Ghiribaldi, Alberto; Ludovici, Daniele; Favalli, Michele; Bertozzi, Davide     dettagli >>
IEEE, IEEE/IFIP 19th International Conference on VLSI and System-on-Chip (VLSI-SoC)
pp: 308-313, Anno: 2011

High quality test vectors for bridging faults in the presence of IC's parameters variations
Favalli, Michele; Dalpasso, M.    
IEEE CS - press, IEEE Symposium on Defect and Fault Tolerance in VLSI Systems
pp: 448-457, Anno: 2007

Delay fault detection problems in circuits featuring a low combinational depth
Favalli, Michele    
IEEE CS - press, IEEE Defect and Fault Tolerant Symposium in VLSI Systems
pp: 170-178, Anno: 2007

Pulse propagation for the detection of small delay defects
Favalli, Michele    
IEEE - CS Press, DATE'07 (Design Automation and TEst in Europe)
pp: 1-6, Anno: 2007

"Victim gate" crosstalk fault model
Favalli, Michele     dettagli >>
IEEE CS - Press, IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems
pp: 191-199, Anno: 2004

Annotated bit flip fault model
Favalli, Michele     dettagli >>
IEEE - CS Press, Int. Symp. on Defect and Fault Tolerance in VLSI Systems
pp: 366-376, Anno: 2004

An evolutionary approach to the design of on chip pseudorandom test generators
Dalpasso, M.; Favalli, Michele    
IEEE - CS Press, IEEE Design Automation and Test in Europe
pp: 1122-1122, Anno: 2002

Problems due to open faults in the interconnections of self-checking data-paths
Favalli, Michele    
IEEE CS - Press, IEEE Design and Test Automation in Europe (DATE)
pp: 612-617, Anno: 2002

Self-checking scheme for the on-line testing of power supply noise
Favalli, Michele; L., Schiano; B., Ricco'    
IEEE - CS Press, IEEE Design and Test Automation in Europe (DATE)
pp: 832-836, Anno: 2002

Optimization of error detecting codes for the detection of crosstalk originated errors
Favalli, Michele; Metra, C.    
IEEE CS Press, Proc. of Design Automation and test in Europe
pp: 290-296, Anno: 2001

Test pattern generation for iddq: increasing test quality
M., Dalpasso; Favalli, Michele; Olivo, Piero    
IEEE, IEEE VLSI Test Symposium
pp: 304-309, Anno: 1995

Correlation between IDDQ Testing Quality and Sensor Accuracy
Dalpasso, M; Favalli, Michele; Olivo, Piero    
IEEE, IEEE European Design & Test
pp: 568-572, Anno: 1995